Method and arrangement for performing measurements

专利名称：Method and arrangement for performing

measurements of the topography of asurface by means of a thermal emissionfrom the surface

发明人：Franciscus Hermanus Maria Jongsma,Johny

De Brabander

申请号：US10524769申请日：20030806公开号：US07431458B2公开日：20081007

专利附图：

摘要：Method and arrangement for performing measurements of the topography ofa surface (), such as topography of an eye surface (), wherein projecting means () forprojecting an image onto said surface () comprises a projection light source (), andwherein at least a fraction of light leaving the surface () as a result of said projection isreceived using one or more receiving units (), such as charged coupled device (CCD) basedcameras. The topography of the surface () is determined by analysis of said fraction oflight leaving the surface (), due to thermal emission and the image projected onto thesurface () is projected with light comprising a colour for which the surface () is opaque,such as infrared light.

申请人：Franciscus Hermanus Maria Jongsma,Johny De Brabander

地址：Ulestraten NL,Berg en Terblijt NL

国籍：NL,NL

代理机构：Birch, Stewart, Kolasch & Birch, LLP

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