专利名称:Apparatus for measuring response time and
method of measuring of response timeusing the same
发明人:Fusayuki Takeshita,Hiroyuki Kamiya,Kyeong-Hyeon Kim,Yong-hwan Shin,Hak-sun Chang
申请号:US11224998申请日:20050914公开号:US07463826B2公开日:20081209
专利附图:
摘要:An apparatus for measuring response time of a display apparatus including a
photographing part including a charge coupled device camera and a microscope, animage processing part receiving a picture taken from a photographing part andcalculating the response time thereof, and a control part applying a predeterminedimage signal to the display apparatus and controlling the photographing part to take apicture change of the display apparatus at a predetermined time.
申请人:Fusayuki Takeshita,Hiroyuki Kamiya,Kyeong-Hyeon Kim,Yong-hwan Shin,Hak-sun Chang
地址:Seoul KR,Seongnam-si KR,Yongin-si KR,Yongin-si KR,Yongin-si KR
国籍:KR,KR,KR,KR,KR
代理机构:Cantor Colburn LLP
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