Apparatus for testing a chip and methods of making

专利名称：Apparatus for testing a chip and methods of

making and using the same

发明人：Tai-Hung Lin,Chih-Ming Chiang,Yi-Hsien

Lee,Chi-Ming Lee

申请号：US11474108申请日：20060623公开号：US07800391B2公开日：20100921

专利附图：

摘要：An apparatus and method for testing an integrated circuit in a target electronicapplication, wherein the apparatus includes a socket for receiving the integrated circuit, a

modified commercial electronic product which models the target electronic application,and an electrical connection between the socket and the modified commercial electronicproduct. The method of testing an integrated circuit includes placing an integrated circuitin a socket that is coupled to a circuit board substantially identical to that of a circuitboard configured to include the integrated circuit, but which does not include theintegrated circuit, and testing the integrated circuit. A method of making such a testermechanically attaching a socket to a modified commercial electronic product andelectrically connecting an integrated circuit and the modified commercial electronicproduct. This approach allows for cheaper, more comprehensive, and more accuratetesting of an integrated circuit.

申请人：Tai-Hung Lin,Chih-Ming Chiang,Yi-Hsien Lee,Chi-Ming Lee

地址：Pingtung Hsien TW,Hsinchu Hsien TW,Sinjhuang TW,Hsinchu TW

国籍：TW,TW,TW,TW

代理机构：The Law Offices of Andrew D. Fortney

代理人：Andrew D. Fortney

更多信息请下载全文后查看