APPARATUS AND METHOD FOR MEASURING LOAD CURRENT BY

专利名称：APPARATUS AND METHOD FOR

MEASURING LOAD CURRENT BY APPLYINGCOMPENSATED GAIN TO VOLTAGE DERIVEDFROM DRAIN-TO-SOURCE VOLTAGE OFPOWER GATING DEVICE

发明人：NIX, Michael Arn申请号：EP16732096.9申请日：20160608公开号：EP3320349B1公开日：20191204

摘要：Apparatus and method are disclosed for measuring a load current supplied toone or more integrated circuit cores. The apparatus includes a power gating field effecttransistor (FET) comprising a gate, a source, and a drain, wherein the source is coupled toa voltage rail, wherein the drain is coupled to a load, and wherein the gate is configuredto receive a gating voltage to selectively turn on the power gating FET to allow a loadcurrent to flow between the voltage rail and the load; and a differential amplifier

configured to generate a current-related voltage related to the load current by applyinga gain to an input voltage based on a drain-to-source voltage of the power gating FET,wherein the gain varies inversely with the input voltage in response to variation intemperature or gate-to-source voltage of the power gating FET.

代理机构：Wagner & Geyer

更多信息请下载全文后查看