METHOD FOR DETERMINING THE WALL THICKNESS OF A HOL

专利名称：METHOD FOR DETERMINING THE WALL

THICKNESS OF A HOLLOW COMPONENT

发明人：BAST, ULRICH,JABADO, RENE,KRUEGER,

URSUS,RINDLER, MICHAEL,WILKENHOENER,ROLF,REICHE, RALPH,KOERTVELYESSY,DANIEL

申请号：EP05787211.1申请日：20050907公开号：EP1807674B1公开日：20080806

摘要：The invention relates to a method for determining the wall thickness of ahollow component (1). According to said method, a temporally variable magnetic field isused to induce a secondary magnetic field in a component wall (5) surrounding a cavity (3)of the component (1). The thickness of the component wall (5) is determined bydetecting at least one variable of the component wall (5) influencing the secondarymagnetic field. Before the at least one variable is detected, a ferromagnetic material (11)is applied to the side (6) of the component wall (5) facing the cavity (3) or introduced intothe cavity (3). The ferromagnetic material is added by means of a volatile solvent in whichit is ionically dissolved or suspended with a binder as a ferromagnetic powder. The atleast one variable is detected following the evaporation of the solvent.

申请人：SIEMENS AKTIENGESELLSCHAFT,SIEMENS AG,SIEMENS AKTIENGESELLSCHAFT

地址：DE

国籍：DE

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